Service

Journal Editorial Boards:
Conferences:

    PANELIST:
  • "AI, Cognitive Information Processing, and Rebooting Computing" in IEEE International Conference on Rebooting Computing (ICRC 2017)
    • Co-Panelists: Stan Williams, HPE, Tom Conte, Georgia Tech, Trung Tran, Booz-Allen. Organizer: David Mountain, DoD
  • "Security Threats in the Analog / RF Domain: An Academic Perspective" in TxACE Workshop on Secure and Trusted Analog/RF Systems (TxACE STARS 2018)
    • Co-Panelists: Ioannis Savidis, Drexel University, Kaiyuan Yang, Rice University. Moderator: Swaroop Ghosh, Pennsylvania State University
    ORGANIZATION:
  • Special Session Organizer, IEEE Custom Integrated Circuits Conference (CICC 2018), Forum: The Vanishing Boundary Between Digital and Analog”
  • Publicity Chair, 22nd IEEE European Test Symposium (ETS 2017)
  • Special Session Organizer, ACM/IEEE Design Automation Conference (DAC 2016), “Enabling the Internet of Things: Context-Awareness in Sensing, Communication and Computing”
  • Special Session Organizer, IEEE European Test Symposium 2017 (ETS), “Design and Test Needs for Adaptive, Self-Learning and Cognitive Systems”
  • Panel Organizer, in IEEE International Test Conference 2014 (ITC), “Elevator talks on emerging test frontiers”
  • Special Session Organizer, IEEE Sensors 2016, “Context-aware, ultra-low power, energy harvested IoT sensor nodes”
  • Special Session Organizer, IEEE International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) 2016
    EXECUTIVE COMMITTEE MEMBER:
  • IEEE European Test Symposium (ETS 2017)
    TECHNICAL PROGRAM COMMITTEE (TPC):
  •  IEEE Custom Integrated Circuits Conference (CICC 2019)
  • ACM/IEEE Design Automation Conference (DAC 2018)
  • IEEE International Conference on Design, Automation and Test in Europe (DATE 2017, 2018)
  • IEEE International Conference on Computer Aided Design (ICCAD 2017, 2018)
  • IEEE European Test Symposium (ETS 2017, 2018)
  • IEEE International Conference on VLSI Design (VLSID 2013, 2014, 2015, 2017, 2018)
  • IEEE International Test Conference (ITC 2014)
  • IEEE International Mixed-Signals Test Workshop (IMSTW 2017)
  • IEEE International Symposium on VLSI Design and Test 2014
  • IEEE International Workshop on Test and Validation of High Speed Analog Circuits (TVHAC 2013) held in conjunction with IEEE International Test Conference (ITC 2013)                                                                                       
    SESSION CHAIR:
  • ACM/IEEE Design Automation Conference (DAC 2018) for session “Arch Nemesis: Architectural Security”
  • IEEE International Symposium on Low Power Electronics and Design (ISLPED 2017) for session “Analog Circuit Design” 
  • IEEE Engineering in Medicine and Biology Conference (EMBC 2017) for session “Models for Clinical Decision Support” – Co-chair
  • IEEE International Test Conference (ITC 2014) for session “Modeling and Measuring Complex Analog Behaviors” 
  • ACM/IEEE Design Automation Conference (DAC 2012) for session “The Dark Side of Test”
  • ACM/IEEE Design Automation Conference (DAC 2011) for session “New Methods and Metrics in Test and Reliability”
  • Firing Line Expert in IEEE International Test Conference 2014 (ITC 2014) for session “"Fool" Nyquist, Fix Nonlinearity, Tolerate Jitter”
  • IEEE National Aerospace Electronics Conference (NAECON 2016) for session “Emerging Electronics and Microsystems” 
    OTHER:
              • DAC Invited Special Session Speaker, ACM/IEEE Design Automation Conference (DAC 2016), “Context-Adaptive and Energy-Efficient Communication for IoT Sensor Nodes”
              • ICCAD Invited Special Session Speaker, in IEEE International Conference on Computer‑Aided Design 2014 (ICCAD 2014), “Adaptive Designs in Computing, Power Management and Communication for Low-Power Circuits and Systems with Ultra-Wide Dynamic Ranges”
              • Industry Support Group Member, IEEE International Mixed-Signal Testing Workshop (IMSTW) 2015.
              • Industry Liaison for Systems On Nanoscale Information fabriCs (SONIC), 2014-2015
              Journal Reviews:
              • IEEE Journal of Solid State Circuits (JSSC)
              • IEEE Journal of Microwave Theory and Techniques (MTT)
              • IEEE Transaction on Circuits & Systems I (TCAS I)
              • IEEE Transaction on Circuits & Systems II (TCAS II)
              • IEEE Transaction on Computer Aided Design (TCAD)
              • IEEE Transaction on Very Large Scale Integration (TVLSI)
              • IEEE Microwave and Wireless Components Letters (MWCL)
              • IEEE Design and Test Magazine (D&T)
              • ACM Transactions on Design Automation of Electronic Systems (TODAES)
              • IEEE Transactions on Biomedical Circuits and Systems (TBioCAS)
              • Springer Journal of Electronic Testing (JETTA)
              • ACM Journal on Emerging Technologies in Computing Systems (JETC)
              • IEEE Journal of Emerging and Selected Topics in Circuits and Systems (JETCAS)
              • Springer Journal of Medical Systems (JOMS)
              Conference Reviews:            
              • ACM/IEEE Design Automation Conference (DAC)
              • IEEE International Test Conference (ITC)
              • IEEE Design, Automation & Test in Europe (DATE)
              • IEEE VLSI Test Symposium (VTS)
              • IEEE International Symposium on Low Power Electronics & Design (ISLPED)
              • IEEE International Conference on VLSI Design

              SPARC LAB participating at PURDUE NANODAYS with School Students

              Prof. Shreyas Sen showing demonstration of scientific experiments for school students

               
              Sparc Lab Graduate Student Shovan Maity (left)  and Baibhab Chatterjee (right) with School Students

              SparcLab at Nanodays

              Sparc Lab Graduate Student Baibhab Chatterjee explaining experiment to students 


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